1476 search results - page 159 / 296 » Three-dimensional integrated circuits |
207
click to vote
Lab
Neural Systems Engineering Lab (NSEL) at Michigan State University focuses on advancing neuroinformatics science by engineering new theoretical, computational and experimental tool...
227
Voted
DAC
2006
ACM
16 years 7 months ago
2006
ACM
This paper presents analysis methods for energy estimation in RC trees driven by time-varying voltage sources, e.g., buffers, timevarying power supplies, and resonant clock genera...
119
click to vote
ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
—Increasing power densities due to process scaling, combined with high switching activity and poor cooling environments during testing, have the potential to result in high integ...
183
Voted
ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
144
click to vote
ASPDAC
2009
ACM
16 years 20 days ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, ...