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DAC
2002
ACM
16 years 6 months ago
Few electron devices: towards hybrid CMOS-SET integrated circuits
Adrian M. Ionescu, Michel J. Declercq, Santanu Mah...
113
Voted
DAC
2003
ACM
16 years 6 months ago
Statistical timing for parametric yield prediction of digital integrated circuits
Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, ...
79
Voted
DAC
2004
ACM
16 years 6 months ago
A synthesis flow toward fast parasitic closure for radio-frequency integrated circuits
Gang Zhang, E. Aykut Dengi, Ronald A. Rohrer, Rob ...
VLSID
2005
IEEE
153views VLSI» more  VLSID 2005»
16 years 5 months ago
Electromigration-Aware Physical Design of Integrated Circuits
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
Göran Jerke, Jens Lienig
102
Voted
ICCAD
2001
IEEE
77views Hardware» more  ICCAD 2001»
16 years 1 months ago
Practical Considerations in RLCK Crosstalk Analysis for Digital Integrated Circuits
Steven C. Chan, Kenneth L. Shepard