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DAC
2002
ACM
16 years 6 months ago
Few electron devices: towards hybrid CMOS-SET integrated circuits
Adrian M. Ionescu, Michel J. Declercq, Santanu Mah...
113
Voted
DAC
2003
ACM
16 years 6 months ago
Statistical timing for parametric yield prediction of digital integrated circuits
Jochen A. G. Jess, K. Kalafala, Srinath R. Naidu, ...
VLSID
2005
IEEE
153views VLSI» more  VLSID 2005»
16 years 5 months ago
Electromigration-Aware Physical Design of Integrated Circuits
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
Göran Jerke, Jens Lienig
102
Voted
ICCAD
2001
IEEE
77views Hardware» more  ICCAD 2001»
16 years 1 months ago
Practical Considerations in RLCK Crosstalk Analysis for Digital Integrated Circuits
Steven C. Chan, Kenneth L. Shepard