6111 search results - page 227 / 1223 » Time, Hardware, and Uniformity |
ASPDAC
2005
ACM
15 years 2 months ago
2005
ACM
Abstract— As VLSI technology enters the ultra-deep submicron era, wire coupling capacitance starts to dominate self capacitance and can no longer be neglected in timing driven ro...
99
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ICCAD
2004
IEEE
15 years 9 months ago
2004
IEEE
—This paper introduces a simple method for calculating the times at which any signal crosses a prespecified threshold voltage (e.g., 10%, 20%, 50%, etc.) directly from the moment...
118
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SBACPAD
2008
IEEE
15 years 7 months ago
2008
IEEE
Single processor technology has been evolving across last decades, but due to physical limitations of chip manufacturing process, the industry is pursuing alternatives to sustain ...
86
Voted
CHARME
2005
Springer
15 years 6 months ago
2005
Springer
Timing diagrams are useful for capturing temporal specifications in which all mentioned events are required to occur. We first show that translating timing diagrams with both par...
108
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DATE
2004
IEEE
15 years 4 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...