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91
Voted
DATE
2007
IEEE
15 years 7 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
108
Voted
ICCAD
2007
IEEE
15 years 7 months ago
2007
IEEE
Modeling the effect of coupling noise on circuit delay is a key issue in static timing analysis (STA) and involves the “victimaggressor alignment” problem. As delay-noise depe...
106
Voted
ISQED
2007
IEEE
15 years 7 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...
119
click to vote
SEUS
2005
IEEE
15 years 6 months ago
2005
IEEE
In the last years the number of electronic control systems has increased significantly. In order to stay competitive more and more functionality is integrated into more and more p...
114
click to vote
ISPD
2003
ACM
15 years 6 months ago
2003
ACM
This paper presents a new timing driven force directed placement algorithm that meets physical net length constraints as well as constraints on specific pin sets. It is the first ...