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106
Voted
EUROSYS
2008
ACM
15 years 9 months ago
2008
ACM
Non-uniform utilization of functional units in combination with hardware mechanisms such as clock gating leads to different power consumptions in different parts of a processor ch...
97
Voted
ICCD
2006
IEEE
15 years 9 months ago
2006
IEEE
Abstract— Gate leakage (direct tunneling current for sub65nm CMOS) can severely affect both the transient and steady state behaviors of CMOS circuits. In this paper we quantify t...
96
Voted
ICCD
2005
IEEE
15 years 9 months ago
2005
IEEE
We propose VAriable Length Value Encoding (VALVE) technique to reduce the power consumption in the off-chip data buses. While past research has focused on encoding fixed length da...
101
click to vote
ICCAD
2008
IEEE
15 years 9 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
ICCAD
2007
IEEE
15 years 9 months ago
2007
IEEE
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....