Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
: NAND flash-based solid-state drives (SSDs) are increasingly being deployed in storage systems at different levels such as buffer-caches and even secondary storage. However, the ...
We develop two simple interval-based models for dynamic superscalar processors. These models allow us to: i) predict with great accuracy performance and power consumption under va...
Most microprocessor chips today use an out-of-order instruction execution mechanism. This mechanism allows superscalar processors to extract reasonably high levels of instruction ...
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...