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DAC
2007
ACM
15 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
FAST
2011
14 years 29 days ago
Leveraging Value Locality in Optimizing NAND Flash-based SSDs
: NAND flash-based solid-state drives (SSDs) are increasingly being deployed in storage systems at different levels such as buffer-caches and even secondary storage. However, the ...
Aayush Gupta, Raghav Pisolkar, Bhuvan Urgaonkar, A...
94
Voted
CF
2010
ACM
15 years 2 months ago
Interval-based models for run-time DVFS orchestration in superscalar processors
We develop two simple interval-based models for dynamic superscalar processors. These models allow us to: i) predict with great accuracy performance and power consumption under va...
Georgios Keramidas, Vasileios Spiliopoulos, Stefan...
CJ
2006
84views more  CJ 2006»
14 years 9 months ago
Instruction Level Parallelism through Microthreading - A Scalable Approach to Chip Multiprocessors
Most microprocessor chips today use an out-of-order instruction execution mechanism. This mechanism allows superscalar processors to extract reasonably high levels of instruction ...
Kostas Bousias, Nabil Hasasneh, Chris R. Jesshope
110
Voted
DSN
2009
IEEE
15 years 4 months ago
Low overhead Soft Error Mitigation techniques for high-performance and aggressive systems
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...
Naga Durga Prasad Avirneni, Viswanathan Subramania...