5639 search results - page 144 / 1128 » Timed Abstract Non-interference |
ICCAD
2006
IEEE
15 years 10 months ago
2006
IEEE
Abstract—Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process c...
PKDD
2009
Springer
15 years 8 months ago
2009
Springer
Abstract. We present a method for applying machine learning algorithms to the automatic classification of astronomy star surveys using time series of star brightness. Currently su...
102
click to vote
RTSS
2008
IEEE
15 years 8 months ago
2008
IEEE
Abstract—We apply automata theory to specifying behavioral interfaces of objects and show how to check schedulability and compatibility of real time asynchronous objects. The beh...
117
click to vote
PATMOS
2007
Springer
15 years 8 months ago
2007
Springer
Abstract. The continuous miniaturization of semiconductor devices imposes serious threats to design robustness against process variations and environmental fluctuations. Modern ci...
149
Voted
RTSS
2005
IEEE
15 years 7 months ago
2005
IEEE
Abstract— Dynamic voltage scaling (DVS) is a promising technique for battery-powered systems to conserve energy consumption. Most existing DVS algorithms assume information about...