5639 search results - page 744 / 1128 » Timed Abstract Non-interference |
158
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ICCD
2001
IEEE
16 years 1 months ago
2001
IEEE
Abstract-- Scaling the minimum feature size of VLSI circuits to sub-quarter micron and its clock frequency to 2GHz has caused crosstalk noise to become a serious problem, that degr...
152
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ICCAD
2008
IEEE
16 years 1 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
110
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ICCAD
2007
IEEE
16 years 1 months ago
2007
IEEE
Abstract—Because of the today’s market demand for highperformance, high-density portable hand-held applications, electronic system design technology has shifted the focus from ...
145
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ICCAD
2006
IEEE
16 years 1 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
130
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ICCAD
2004
IEEE
16 years 1 months ago
2004
IEEE
Abstract—The slack time in real-time systems can be used by recovery schemes to increase system reliability as well as by frequency and voltage scaling techniques to save energy....