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77
Voted
ASYNC
2007
IEEE
107views Hardware» more  ASYNC 2007»
15 years 7 months ago
On-chip samplers for test and debug of asynchronous circuits
On-chip high-bandwidth sampling circuits supplement traditional test and debug techniques by non-invasively probing analog voltages for off-chip measurement. Existing circuits rel...
Frankie Liu, Ron Ho, Robert J. Drost, Scott Fairba...
110
Voted
FPT
2005
IEEE
133views Hardware» more  FPT 2005»
15 years 6 months ago
FPGA-Based Conformance Testing and System Prototyping of an MPEG-4 SA-DCT Hardware Accelerator
Two FPGA implementations of a Shape Adaptive Discrete Cosine Transform (SA-DCT) accelerator are presented in this paper: one PCI-based and the other AMBA-based. The former is used...
Andrew Kinane, Alan Casey, Valentin Muresan, Noel ...
FSTTCS
2004
Springer
15 years 6 months ago
Testing Geometric Convexity
We consider the problem of determining whether a given set S in Rn is approximately convex, i.e., if there is a convex set K ∈ Rn such that the volume of their symmetric differe...
Luis Rademacher, Santosh Vempala
102
Voted
VTS
2003
IEEE
95views Hardware» more  VTS 2003»
15 years 6 months ago
Testing SoC Interconnects for Signal Integrity Using Boundary Scan
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nour...
65
Voted
MA
2010
Springer
85views Communications» more  MA 2010»
14 years 11 months ago
K-sample subsampling in general spaces: The case of independent time series
The problem of subsampling in two-sample and K-sample settings is addressed where both the data and the statistics of interest take values in general spaces. We focus on the case ...
Dimitris N. Politis, Joseph P. Romano