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CSSC
2010
123views more  CSSC 2010»
15 years 2 months ago
Testing Fractional Order of Long Memory Processes: A Monte Carlo Study
Testing the fractionally integrated order of seasonal and non-seasonal unit roots is quite important for the economic and financial time series modelling. In this paper, Robinson ...
Laurent Ferrara, Dominique Guegan, Zhiping Lu
DAGSTUHL
2007
15 years 3 months ago
Diagonal Circuit Identity Testing and Lower Bounds
In this paper we give the first deterministic polynomial time algorithm for testing whether a diagonal depth-3 circuit C(x1, . . . , xn) (i.e. C is a sum of powers of linear funct...
Nitin Saxena
TCAD
2010
102views more  TCAD 2010»
14 years 8 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
DDECS
2009
IEEE
149views Hardware» more  DDECS 2009»
15 years 5 months ago
Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
Yiorgos Sfikas, Yiorgos Tsiatouhas
120
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BMCBI
2007
197views more  BMCBI 2007»
15 years 2 months ago
Boolean networks using the chi-square test for inferring large-scale gene regulatory networks
Background: Boolean network (BN) modeling is a commonly used method for constructing gene regulatory networks from time series microarray data. However, its major drawback is that...
Haseong Kim, Jae K. Lee, Taesung Park