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113
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ICCD
2002
IEEE
16 years 4 days ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
168
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ICSM
2008
IEEE
15 years 9 months ago
2008
IEEE
In mission critical systems, such as those developed by NASA, it is very important that the test engineers properly recognize the severity of each issue they identify during testi...
102
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DATE
2010
IEEE
15 years 8 months ago
2010
IEEE
—The admission control problem is concerned with determining whether a new task may be accepted by a system consisting of a set of running tasks, such that the already admitted a...
136
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DATE
2000
IEEE
15 years 7 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
156
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ICSE
1999
IEEE-ACM
15 years 7 months ago
1999
IEEE-ACM
Formal verification methods are used only sparingly in software development. The most successful methods to date are based on the use of model checking tools. To use such he user ...