4306 search results - page 363 / 862 » Timed Testing with TorX |
132
Voted
VTS
2000
IEEE
15 years 7 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
111
click to vote
HAPTICS
2010
IEEE
15 years 7 months ago
2010
IEEE
Abstract. The Nine Hole Peg Test (NHPT) is routinely used in clinical environments to evaluate a patient's fine hand control. A physician measures the total time required to i...
90
Voted
DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...
100
Voted
AUSAI
2005
Springer
15 years 9 months ago
2005
Springer
In this work, we develop a multi-exchange heuristic based on an estimation improvement graph embedded in a simulated annealing to solve a problem arising in plant location planning...
107
click to vote
DFT
2000
IEEE
15 years 8 months ago
2000
IEEE
Many fault-tolerant architectures are based on the single-fault assumption, hence accumulation of dormant faults represents a potential reliability hazard. Based on the example of...