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VTS
1997
IEEE
90views Hardware» more  VTS 1997»
15 years 1 months ago
SHOrt voltage elevation (SHOVE) test for weak CMOS ICs
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
Jonathan T.-Y. Chang, Edward J. McCluskey
AICCSA
2001
IEEE
83views Hardware» more  AICCSA 2001»
15 years 1 months ago
A Measure for Component Interaction Test Coverage
A trend in software development is to assemble a system from a number of components. These may be either available commercially off-the-shelf, or by the use of network-based resou...
Alan W. Williams, Robert L. Probert
EVOW
2008
Springer
14 years 11 months ago
An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
Danilo Ravotto, Ernesto Sánchez, Massimilia...
ECRTS
2009
IEEE
14 years 7 months ago
Implementation of a Speedup-Optimal Global EDF Schedulability Test
A recent result in [13] has demonstrated the existence of a sufficient global EDF schedulability test for sporadic task systems that makes the following guarantee: any task system...
Sanjoy K. Baruah, Vincenzo Bonifaci, Alberto March...
SPLC
2008
14 years 11 months ago
Functional Testing of Feature Model Analysis Tools. A First Step
The automated analysis of Feature Models (FMs) focuses on the usage of different logic paradigms and solvers to implement a number of analysis operations on FMs. The implementatio...
Sergio Segura, David Benavides, Antonio Ruiz Cort&...