There is increasing interest in the development of reliable, rapid and non-intrusive security control systems. Among the many approaches, biometrics such as palmprints provide hig...
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
Clock gating is the insertion of combinational logic along the clock path to prevent the unnecessary switching of registers and reduce dynamic power consumption. The conditions un...
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...