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» Timed circuits: a new paradigm for high-speed design
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GLVLSI
2000
IEEE
145views VLSI» more  GLVLSI 2000»
15 years 6 months ago
Manhattan or non-Manhattan?: a study of alternative VLSI routing architectures
Circuit interconnect has become a substantial obstacle in the design of high performance systems. In this paper we explore a new routing paradigm that strikes at the root of the i...
Cheng-Kok Koh, Patrick H. Madden
ISLPED
2005
ACM
68views Hardware» more  ISLPED 2005»
15 years 7 months ago
Two efficient methods to reduce power and testing time
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
Il-soo Lee, Tony Ambler
ICCAD
2001
IEEE
108views Hardware» more  ICCAD 2001»
15 years 11 months ago
Placement Driven Retiming with a Coupled Edge Timing Model
Retiming is a widely investigated technique for performance optimization. It performs powerful modifications on a circuit netlist. However, often it is not clear, whether the pred...
Ingmar Neumann, Wolfgang Kunz
ETS
2011
IEEE
220views Hardware» more  ETS 2011»
14 years 1 months ago
Structural In-Field Diagnosis for Random Logic Circuits
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
Alejandro Cook, Melanie Elm, Hans-Joachim Wunderli...
DATE
2002
IEEE
135views Hardware» more  DATE 2002»
15 years 7 months ago
Reducing Test Application Time Through Test Data Mutation Encoding
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
Sherief Reda, Alex Orailoglu