In previous papers [SC05, SBC+07], some of us predicted the end of "one size fits all" as a commercial relational DBMS paradigm. These papers presented reasons and exper...
Michael Stonebraker, Samuel Madden, Daniel J. Abad...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski,...
Delay evaluation is always a crucial concern in the VLSI design and it becomes increasingly more critical in the nowadays deep-submicron technology. To obtain an accurate delay va...
Muzhou Shao, Martin D. F. Wong, Huijing Cao, Youxi...
- Phase noise is a topic of theoretical and practical interest in electronic circuits. Although progress has been made in the characterization of its description, there are still c...
Youssef Nasser, Mathieu Des Noes, Laurent Ros, Gen...
Abstract. Graph cuts has emerged as a preferred method to solve a class of energy minimization problems in computer vision. It has been shown that graph cut algorithms designed kee...
Chetan Arora, Subhashis Banerjee, Prem Kalra, S. N...