Balanced dynamic dual-rail gates and asynchronous circuits have been shown, if implemented correctly, to have natural and efficient resistance to side-channel attacks. Despite thei...
Konrad J. Kulikowski, Alexander B. Smirnov, Alexan...
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
A method for measuring inter-symbol interference, duty cycle distortion, random jitter and periodic jitter is described. The Blackman-Tukey method of signal analysis is used. This...
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
This paper presents a methodology for accurate propagation of delay information through a gate for the purpose of static timing analysis (STA) in the presence of noise. Convention...
Shahin Nazarian, Massoud Pedram, Emre Tuncer, Tao ...