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ATS
2000
IEEE
145views Hardware» more  ATS 2000»
15 years 4 months ago
Compaction-based test generation using state and fault information
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
119
Voted
ICCAD
1999
IEEE
153views Hardware» more  ICCAD 1999»
15 years 4 months ago
Cycle time and slack optimization for VLSI-chips
We consider the problem of finding an optimal clock schedule, i.e. optimal arrival times for clock signals at latches of a VLSI chip. We describe a general model which includes al...
Christoph Albrecht, Bernhard Korte, Jürgen Sc...
103
Voted
WISES
2004
15 years 1 months ago
Embedded Real-Time-Tracer - An Approach with IDE
-- Debugging software that runs on highly integrated System-on-Chip devices is complicated because conventional debug tools (like traditional In-Circuit Emulators and Logic Analyze...
Babak Rahbaran, Matthias Függer, Andreas Stei...
128
Voted
RTSS
2005
IEEE
15 years 6 months ago
Event Count Automata: A State-Based Model for Stream Processing Systems
Recently there has been a growing interest in models and methods targeted towards the (co)design of stream processing applications; e.g. those for audio/video processing. Streams ...
Samarjit Chakraborty, Linh T. X. Phan, P. S. Thiag...
115
Voted
MJ
2007
119views more  MJ 2007»
14 years 12 months ago
Automated energy calculation and estimation for delay-insensitive digital circuits
With increasingly smaller feature sizes and higher on-chip densities, the power dissipation of VLSI systems has become a primary concern for designers. This paper first describes...
Venkat Satagopan, Bonita Bhaskaran, Anshul Singh, ...