We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
We consider the problem of finding an optimal clock schedule, i.e. optimal arrival times for clock signals at latches of a VLSI chip. We describe a general model which includes al...
-- Debugging software that runs on highly integrated System-on-Chip devices is complicated because conventional debug tools (like traditional In-Circuit Emulators and Logic Analyze...
Recently there has been a growing interest in models and methods targeted towards the (co)design of stream processing applications; e.g. those for audio/video processing. Streams ...
Samarjit Chakraborty, Linh T. X. Phan, P. S. Thiag...
With increasingly smaller feature sizes and higher on-chip densities, the power dissipation of VLSI systems has become a primary concern for designers. This paper first describes...