This paper presents an efficient method to reduce complexities of a linear network in s-domain. The new method works on circuit matrices directly and reduces the circuit complexi...
— Design, Verification and Test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnost...
In this paper we examine a latency insensitive network composed of very fast and simple circuits that connects SoC cores that are also latency insensitive, de-synchronized, or asy...
Daniel Gebhardt, JunBok You, W. Scott Lee, Kenneth...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...