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VTS
2003
IEEE
122views Hardware» more  VTS 2003»
15 years 5 months ago
A Reconfigurable Shared Scan-in Architecture
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
Samitha Samaranayake, Emil Gizdarski, Nodari Sitch...
89
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DAC
2004
ACM
16 years 1 months ago
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
Ashish Srivastava, Dennis Sylvester, David Blaauw
95
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TCAD
2010
106views more  TCAD 2010»
14 years 10 months ago
Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies
—With the scaling of complementary metal–oxide– semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacit...
Zhangcai Huang, Atsushi Kurokawa, Masanori Hashimo...
TCAD
2002
115views more  TCAD 2002»
15 years 2 days ago
Analytical models for crosstalk excitation and propagation in VLSI circuits
We develop a general methodology to analyze crosstalk effects that are likely to cause errors in deep submicron high speed circuits. We focus on crosstalk due to capacitive coupli...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer
ANSS
2000
IEEE
15 years 4 months ago
Multi-Resolution Modeling of Power Converter Using Waveform Reconstruction
Computer simulation of switching power converters is complicated by the discontinuous (switching) nature of the converter waveforms. When switching details of the waveforms are of...
Yuwei Luo, Roger Dougal, Enrico Santi