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ICCAD
2001
IEEE
100views Hardware» more  ICCAD 2001»
15 years 7 months ago
Coupled Analysis of Electromigration Reliability and Performance in ULSI Signal Nets
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
Kaustav Banerjee, Amit Mehrotra
DAC
2006
ACM
15 years 11 months ago
Fast analysis of structured power grid by triangularization based structure preserving model order reduction
In this paper, a Triangularization Based Structure preserving (TBS) model order reduction is proposed to verify power integrity of on-chip structured power grid. The power grid is...
Hao Yu, Yiyu Shi, Lei He
FMCAD
2000
Springer
15 years 1 months ago
SAT-Based Image Computation with Application in Reachability Analysis
Image computation nds wide application in VLSI CAD, such as state reachability analysis in formal veri cation and synthesis, combinational veri cation, combinational and sequential...
Aarti Gupta, Zijiang Yang, Pranav Ashar, Anubhav G...
CORR
2010
Springer
163views Education» more  CORR 2010»
14 years 5 months ago
Toward a Push-Scalable Global Internet
Push message delivery, where a client maintains an "always-on" connection with a server in order to be notified of a (asynchronous) message arrival in real-time, is incre...
Sachin Agarwal
ASPDAC
2006
ACM
121views Hardware» more  ASPDAC 2006»
15 years 1 months ago
Efficient early stage resonance estimation techniques for C4 package
- In this paper, we study the relationship between C4 package resonance effects and logical switching timing correlations, which has not been thoroughly investigated in the past. W...
Jin Shi, Yici Cai, Sheldon X.-D. Tan, Xianlong Hon...