184 search results - page 27 / 37 » Timing budgeting under arbitrary process variations |
103
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DSN
2007
IEEE
15 years 4 months ago
2007
IEEE
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...
UAI
2000
14 years 11 months ago
2000
We propose a new approach to the problem of searching a space of policies for a Markov decision process (MDP) or a partially observable Markov decision process (POMDP), given a mo...
103
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ASPDAC
2010
ACM
14 years 8 months ago
2010
ACM
As Double Patterning Lithography(DPL) becomes the leading candidate for sub-30nm lithography process, we need a fast and lithography friendly decomposition framework. In this pape...
ICCAD
2003
IEEE
15 years 6 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
ICASSP
2008
IEEE
15 years 4 months ago
2008
IEEE
This paper presents an approach for a multi-cue based two-dimensional gesture recognition that combines two different forms of cues, namely shape cues and motion cues, in a suppor...