2026 search results - page 74 / 406 » Tools for Test Case Generation |
ISCAS
1999
IEEE
15 years 4 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
107
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ICCAD
1997
IEEE
15 years 4 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
GECCO
2007
Springer
15 years 6 months ago
2007
Springer
Fault-based testing is often advocated to overcome limitations of other testing approaches; however it is also recognized as being expensive. On the other hand, evolutionary algor...
101
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COMPSAC
2005
IEEE
15 years 6 months ago
2005
IEEE
Automatic test data generation leads to the identification of input values on which a selected path or a selected branch is executed within a program (path-oriented vs goalorient...
112
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DATE
2009
IEEE
15 years 7 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...