2026 search results - page 77 / 406 » Tools for Test Case Generation |
SIGSOFT
2007
ACM
16 years 1 months ago
2007
ACM
There has recently been a great deal of interest in search? based test data generation, with many local and global search algorithms being proposed. However, to date, there has be...
103
Voted
ICDE
2010
IEEE
15 years 7 months ago
2010
IEEE
Abstract— Checking if an SQL query has been written correctly is not an easy task. Formal verification is not applicable, since it is based on comparing a specification with an...
103
Voted
ICCAD
2002
IEEE
15 years 9 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
122
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SAC
2008
ACM
15 years 1 days ago
2008
ACM
In this paper we investigate and propose a fully automated technique to perform conformance checking of Java implementations against UML class diagrams. In our approach, we reused...
91
Voted
DDECS
2007
IEEE
15 years 7 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...