2715 search results - page 146 / 543 » Total Generalized Variation |
130
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DAC
2004
ACM
15 years 7 months ago
2004
ACM
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...
129
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DAC
2004
ACM
15 years 7 months ago
2004
ACM
The high leakage current in nano-meter regimes is becoming a significant portion of power dissipation in CMOS circuits as threshold voltage, channel length, and gate oxide thickne...
142
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DAC
2010
ACM
15 years 6 months ago
2010
ACM
The level of security provided by digital rights management functions and cryptographic protocols depend heavily on the security of an embedded secret key. The current practice of...
WSC
2004
15 years 4 months ago
2004
Simulation composability is a difficult capability to achieve due to the challenges of creating components, selecting combinations of components, and integrating the selected comp...
138
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DAC
2010
ACM
15 years 3 months ago
2010
ACM
With technology scaling down to 90nm and below, many yield-driven design and optimization methodologies have been proposed to cope with the prominent process variation and to incr...