2715 search results - page 147 / 543 » Total Generalized Variation |
141
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DAC
2012
ACM
13 years 5 months ago
2012
ACM
Large-scale process variations can significantly limit the practical utility of microelectro-mechanical systems (MEMS) for RF (radio frequency) applications. In this paper we desc...
113
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ICRA
2005
IEEE
15 years 8 months ago
2005
IEEE
— A new three degrees of freedom translational parallel manipulator (TPM) with fixed actuators, called a general 3-PRC TPM, is proposed in this paper. The mobility of the manipu...
133
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SSPR
2004
Springer
15 years 8 months ago
2004
Springer
Model-based image recognition requires a general model of the object that should be detected in an image. In many applications such models are not known a-priori instead of they mu...
127
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DAC
2005
ACM
16 years 4 months ago
2005
ACM
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...
125
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ISPD
2010
ACM
15 years 10 months ago
2010
ACM
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...