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102
Voted
DAC
2009
ACM
16 years 4 months ago
SRAM parametric failure analysis
With aggressive technology scaling, SRAM design has been seriously challenged by the difficulties in analyzing rare failure events. In this paper we propose to create statistical ...
Jian Wang, Soner Yaldiz, Xin Li, Lawrence T. Pileg...
123
Voted
DAC
2008
ACM
16 years 4 months ago
Cache modeling in probabilistic execution time analysis
Multimedia-dominated consumer electronics devices (such as cellular phone, digital camera, etc.) operate under soft real-time constraints. Overly pessimistic worst-case execution ...
Yun Liang, Tulika Mitra
137
Voted
DAC
2008
ACM
16 years 4 months ago
Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array fo
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
103
Voted
DAC
2007
ACM
16 years 4 months ago
High Performance and Low Power Electronics on Flexible Substrate
We propose a design and optimization methodology for high performance and ultra low power digital applications on flexible substrate using Low Temperature Polycrystalline Silicon ...
Jing Li, Kunhyuk Kang, Aditya Bansal, Kaushik Roy
115
Voted
DAC
2003
ACM
16 years 4 months ago
A hybrid SAT-based decision procedure for separation logic with uninterpreted functions
SAT-based decision procedures for quantifier-free fragments of firstorder logic have proved to be useful in formal verification. These decision procedures are either based on enco...
Sanjit A. Seshia, Shuvendu K. Lahiri, Randal E. Br...