The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
Graphs have been widely used to model relationships among data. For large graphs, excessive edge crossings make the display visually cluttered and thus difficult to explore. In thi...
Weiwei Cui, Hong Zhou, Huamin Qu, Pak Chung Wong, ...
—As CMOS process technology advances towards 32nm, SoC complexity continuously grows but its dependability significantly decreases. In this paper, a beamforming chip 1 is designe...
Architects are faced with the problem of building enterprise scale information systems, with streamlined, automated internal business processes and web-enabled business functions,...
Numerical applications frequently contain nested loop structures that process large arrays of data. The execution of these loop structures often produces memory preference pattern...
Yoji Yamada, John Gyllenhall, Grant Haab, Wen-mei ...