1491 search results - page 109 / 299 » Training Linear Discriminant Analysis in Linear Time |
ICCD
2008
IEEE
15 years 6 months ago
2008
IEEE
—IR drop noise has become a critical issue in advanced process technologies. Traditionally, timing analysis in which the IR drop noise is considered assumes a worst-case IR drop ...
ICCAD
2005
IEEE
15 years 6 months ago
2005
IEEE
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
CDC
2008
IEEE
15 years 4 months ago
2008
IEEE
Abstract— This paper considers the control problem for selfservowriting in disk drives where information propagation occurs in two independent directions, i.e. time and track num...
ICPR
2002
IEEE
15 years 11 months ago
2002
IEEE
The small sample size problem is often encountered in pattern recognition. It results in the singularity of the within-class scatter matrix Sw in Linear Discriminant Analysis (LDA...
ICPR
2010
IEEE
15 years 4 months ago
2010
IEEE
Matching near-infrared (NIR) face images to visible light (VIS) face images offers a robust approach to face recognition with unconstrained illumination. In this paper we propose ...