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Transistor Stuck-Open Fault Detection in Multilevel CMOS Cir...
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GLVLSI
1999
IEEE
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Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits
15 years 7 months ago
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Mostafa H. Abd-El-Barr, Yanging Xu, Carl McCrosky
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ITC
1989
IEEE
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CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations
15 years 7 months ago
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- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
Jerry M. Soden, R. Keith Treece, Michael R. Taylor...
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