1640 search results - page 176 / 328 » Transistor-Level Timing Analysis Using Embedded Simulation |
114
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MICRO
2007
IEEE
15 years 9 months ago
2007
IEEE
Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in fu...
108
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ICCAD
2001
IEEE
16 years 8 days ago
2001
IEEE
— Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on ...
151
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VTC
2008
IEEE
15 years 9 months ago
2008
IEEE
Abstract— Multi-hop relaying has attracted considerable attention recently as a key technique for improving cell coverage and throughput in wireless communication. We modelled va...
140
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ISOLA
2004
Springer
15 years 8 months ago
2004
Springer
Abstract. This paper presents a formal analysis of the device discovery phase of the Bluetooth wireless communication protocol. The performance of this process is the result of a c...
119
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KDD
2006
ACM
16 years 3 months ago
2006
ACM
Finding patterns of social interaction within a population has wide-ranging applications including: disease modeling, cultural and information transmission, and behavioral ecology...