3192 search results - page 203 / 639 » Translating Model Simulators to Analysis Models |
139
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CORR
2007
Springer
15 years 3 months ago
2007
Springer
— In order to optimize the costs and time of design of the new products while improving their quality, concurrent engineering is based on the digital model of these products, the...
118
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DATE
2002
IEEE
15 years 8 months ago
2002
IEEE
: It has always been assumed that fault models in memories are sufficiently precise for specifying the faulty behavior. This means that, given a fault model, it should be possible...
122
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WSC
2008
15 years 5 months ago
2008
Cluster tools play an important role in modern semiconductor fabs. Due to their complexity in configuration and their varying material flow, the creation of accurate throughput mo...
109
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ICCAD
1993
IEEE
15 years 7 months ago
1993
IEEE
An analytical-knowledge-based statistical method is developed to derive macromodels for the highly nonlinear A.C. response functions of CMOS Op-amp circuits. Simple circuit analys...
135
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COMPSAC
2005
IEEE
15 years 8 months ago
2005
IEEE
Performance analysis gains more attention in recent years by researchers who focus their study on the early software development stages to mitigate the risk of redesign as problem...