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ATS
2003
IEEE
126views Hardware» more  ATS 2003»
15 years 5 months ago
Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
Zaid Al-Ars, A. J. van de Goor
ICCV
2007
IEEE
16 years 1 months ago
Fitting a Morphable Model to 3D Scans of Faces
This paper presents a top-down approach to 3D data analysis by fitting a Morphable Model to scans of faces. In a unified framework, the algorithm optimizes shape, texture, pose an...
Volker Blanz, Kristina Scherbaum, Hans-Peter Seide...
CVPR
2004
IEEE
16 years 1 months ago
Linear Projection Methods in Face Recognition under Unconstrained Illuminations: A Comparative Study
Face recognition under unconstrained illuminations (FR/I) received extensive study because of the existence of illumination subspace. [2] presented a study on the comparison betwe...
Qi Li, Jieping Ye, Chandra Kambhamettu
DAGM
2008
Springer
15 years 1 months ago
Convex Hodge Decomposition of Image Flows
The total variation (TV) measure is a key concept in the field of variational image analysis. Introduced by Rudin, Osher and Fatemi in connection with image denoising, it also prov...
Jing Yuan, Gabriele Steidl, Christoph Schnörr
ICA
2004
Springer
15 years 5 months ago
ICA Using Kernel Entropy Estimation with NlogN Complexity
Abstract. Mutual information (MI) is a common criterion in independent component analysis (ICA) optimization. MI is derived from probability density functions (PDF). There are scen...
Sarit Shwartz, Michael Zibulevsky, Yoav Y. Schechn...