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ICCD
2002
IEEE
108views Hardware» more  ICCD 2002»
16 years 3 months ago
Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic...
EDOC
2009
IEEE
16 years 1 months ago
Using Enterprise Architecture Management Patterns to Complement TOGAF
—The design of an Enterprise Architecture (EA) management function for an enterprise is no easy task. Various frameworks exist as well as EA management tools, which promise to de...
Sabine Buckl, Alexander M. Ernst, Florian Matthes,...
ADBIS
2009
Springer
127views Database» more  ADBIS 2009»
16 years 27 days ago
Window Update Patterns in Stream Operators
Continuous queries applied over nonterminating data streams usually specify windows in order to obtain an evolving –yet restricted– set of tuples and thus provide timely result...
Kostas Patroumpas, Timos K. Sellis
CAISE
2009
Springer
16 years 26 days ago
Evaluation Patterns for Analyzing the Costs of Enterprise Information Systems
Introducing enterprise information systems (EIS) is usually associated with high costs. It is therefore crucial to understand those factors that determine or influence these costs...
Bela Mutschler, Manfred Reichert
ASPDAC
2009
ACM
212views Hardware» more  ASPDAC 2009»
16 years 24 days ago
Timing analysis and optimization implications of bimodal CD distribution in double patterning lithography
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...
Kwangok Jeong, Andrew B. Kahng