This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
– We describe in detail the behavior of an inhibitory Central Pattern Generator (CPG) network for robot control. A four-neuron, mutual inhibitory network forms the basic coordina...
M. Anthony Lewis, Francesco Tenore, Ralph Etienne-...
user interface application model dialogue model Design Design Transformation by patterns Transformation by patterns class diagram task model l use model b.-object model device mod...
Peter Forbrig, Anke Dittmar, Daniel Reichart, Dani...
—This paper presents a 2D flow visualization user study that we conducted using new methodologies to increase the objectiveness. We evaluated grid-based variable-size arrows, eve...
Zhanping Liu, Shangshu Cai, J. Edward Swan II, Rob...
i In this paper, we identify the unique challenges in deploying parallelism on TCAM-based pattern matching for Network Intrusion Detection Systems (NIDSes). We resolve two critica...
Kai Zheng, Xin Zhang, Zhiping Cai, Zhijun Wang, Ba...