Sciweavers

1951 search results - page 152 / 391
» UML-Based integration testing
Sort
View
DATE
2005
IEEE
112views Hardware» more  DATE 2005»
15 years 10 months ago
Simultaneous Reduction of Dynamic and Static Power in Scan Structures
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...
Shervin Sharifi, Javid Jaffari, Mohammad Hosseinab...
ISORC
2005
IEEE
15 years 9 months ago
A Provenance-Aware Weighted Fault Tolerance Scheme for Service-Based Applications
Service-orientation has been proposed as a way of facilitating the development and integration of increasingly complex and heterogeneous system components. However, there are many...
Paul Townend, Paul T. Groth, Jie Xu
ECAI
2004
Springer
15 years 9 months ago
High-Level Observations in Java Debugging
Recent years have seen considerable developments in modeling techniques for automatic fault location in programs. However, much of this research considered the models from a standa...
Wolfgang Mayer, Markus Stumptner
MHCI
2004
Springer
15 years 9 months ago
Using Landmarks to Support Older People in Navigation
Although landmarks are an integral aspect of navigation, they have rarely been used within electronic navigation aids. This paper describes the design of a pedestrian navigation ai...
Joy Goodman, Philip D. Gray, Kartik Khammampad, St...
RAID
2004
Springer
15 years 9 months ago
Fast Detection of Scanning Worm Infections
Worm detection and response systems must act quickly to identify and quarantine scanning worms, as when left unchecked such worms have been able to infect the majority of vulnerabl...
Stuart E. Schechter, Jaeyeon Jung, Arthur W. Berge...