872 search results - page 10 / 175 » UML-based design test generation |
EVOW
2001
Springer
15 years 1 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
DATE
2000
IEEE
15 years 1 months ago
2000
IEEE
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
ATS
2009
IEEE
15 years 4 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
EDM
2009
14 years 7 months ago
2009
This paper describes a novel method to create a quantitative model of an educational content domain of related practice item-types using learning curves. By using a pairwise test t...
GLVLSI
2002
IEEE
15 years 2 months ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...