872 search results - page 11 / 175 » UML-based design test generation |
DSD
2007
IEEE
15 years 3 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
DAC
2003
ACM
15 years 10 months ago
2003
ACM
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
ICCD
2004
IEEE
15 years 6 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
This paper develops an improved approach for hierarchical functional test generation for complex chips. In order to deal with the increasing complexity of functional test generati...
DATE
2003
IEEE
15 years 2 months ago
2003
IEEE
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...