872 search results - page 12 / 175 » UML-based design test generation |
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design....
ICTAI
2002
IEEE
15 years 2 months ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
ICST
2008
IEEE
15 years 3 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
DAC
2001
ACM
15 years 10 months ago
2001
ACM
This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from "model-checking"...