872 search results - page 14 / 175 » UML-based design test generation |
101
Voted
COMPSAC
1999
IEEE
15 years 1 months ago
1999
IEEE
Design patterns have been used in object-oriented frameworks such as the IBM San Francisco framework, Apple's Rhaspody, OpenStep, and WebObjects, and DIWB. However, few guide...
101
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IOLTS
2005
IEEE
15 years 3 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
70
Voted
ISCAS
1999
IEEE
15 years 1 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
VLSID
2009
IEEE
15 years 10 months ago
2009
IEEE
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
DATE
2006
IEEE
15 years 3 months ago
2006
IEEE
Functional validation is a major bottleneck in pipelined processor design. Simulation using functional test vectors is the most widely used form of processor validation. While exi...