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IJNSEC
2010
98views more  IJNSEC 2010»
14 years 4 months ago
A Random Bit Generator Using Chaotic Maps
Chaotic systems have many interesting features such as sensitivity on initial condition and system parameter, ergodicity and mixing properties. In this paper, we exploit these int...
Narendra K. Pareek, Vinod Patidar, Krishan K. Sud
DATE
2010
IEEE
149views Hardware» more  DATE 2010»
15 years 1 months ago
Efficient decision ordering techniques for SAT-based test generation
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...
Mingsong Chen, Xiaoke Qin, Prabhat Mishra
DATE
2006
IEEE
108views Hardware» more  DATE 2006»
15 years 3 months ago
Automatic march tests generations for static linked faults in SRAMs
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Gi...
KBSE
2008
IEEE
15 years 3 months ago
An Automated Test Code Generation Method for Web Applications using Activity Oriented Approach
—Automated tests are important for Web applications as they grow more complex day by day. Web application testing frameworks have emerged to help satisfy this need. However, used...
David A. Turner, Moonju Park, Jaehwan Kim, Jinseok...
DATE
2004
IEEE
174views Hardware» more  DATE 2004»
15 years 1 months ago
Graph-Based Functional Test Program Generation for Pipelined Processors
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
Prabhat Mishra, Nikil Dutt