872 search results - page 18 / 175 » UML-based design test generation |
TASE
2009
IEEE
15 years 4 months ago
2009
IEEE
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
ICST
2008
IEEE
15 years 3 months ago
2008
IEEE
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
DATE
2000
IEEE
15 years 1 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
66
Voted
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compat...