872 search results - page 22 / 175 » UML-based design test generation |
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
VLSID
1997
IEEE
15 years 1 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
108
click to vote
ICST
2010
IEEE
14 years 8 months ago
2010
IEEE
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
IICAI
2007
14 years 11 months ago
2007
The paper presents first results of a project that aims at building a model-based tool for functional testing of control software for passenger vehicles. The objective is that this...