872 search results - page 23 / 175 » UML-based design test generation |
FUIN
2007
14 years 9 months ago
2007
Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively few efforts ...
GLVLSI
2002
IEEE
15 years 2 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
ICCD
2004
IEEE
15 years 6 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
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MTV
2005
IEEE
15 years 3 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
PDSE
1998
14 years 10 months ago
1998
The development of correct OO distributed software is a daunting task as soon as the distributed interactions are not trivial. This is due to the inherent complexity of distribute...