872 search results - page 28 / 175 » UML-based design test generation |
ISQED
2002
IEEE
15 years 2 months ago
2002
IEEE
The design methods and the automation of the comparator circuit layout generation for a flash A/D converter are presented in this paper. The threshold inverter quantization (TIQ)...
APCCAS
2006
IEEE
15 years 1 months ago
2006
IEEE
This paper considers z-domain transfer functions whose denominator polynomial possesses the property that the coefficient of zi is greater than the coefficient of zi-1 . Such trans...
88
Voted
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
System-on-chip (SOC) design methodology is becoming the trend in the IC industry. Integrating reusable cores from multiple sources is essential in SOC design, and different design...
100
Voted
TCAD
2011
14 years 4 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
75
Voted
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...