872 search results - page 35 / 175 » UML-based design test generation |
111
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ICCD
2006
IEEE
15 years 10 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
62
Voted
ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
124
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DAC
2002
ACM
16 years 2 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
94
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AIIDE
2007
15 years 4 months ago
2007
This paper proposes the use of an autonomous exploring agent to generate and annotate the waypoint graph as an offline process during level development. The explorer incrementally...
122
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TAICPART
2006
IEEE
15 years 8 months ago
2006
IEEE
The design of complex systems, e.g., telecom services, is nowadays usually based on the integration of components (COTS), loosely coupled in distributed architectures. When compon...