872 search results - page 37 / 175 » UML-based design test generation |
DATE
2005
IEEE
15 years 7 months ago
2005
IEEE
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
116
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ICRA
2009
IEEE
14 years 11 months ago
2009
IEEE
In a previous paper, we developed a robotic finger equipped with optical three-axis tactile sensors, of which the sensing cell can separately detect normal and shearing forces. Wit...
113
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CODES
2008
IEEE
15 years 3 months ago
2008
IEEE
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...
144
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FCCM
2003
IEEE
15 years 7 months ago
2003
IEEE
Two FPGA based implementations of random number generators intended for embedded cryptographic applications are presented. The first is a true random number generator (TRNG) whic...
110
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ICSE
2009
IEEE-ACM
15 years 8 months ago
2009
IEEE-ACM
Developers use unit testing to improve the quality of software systems. Current development tools for unit testing help to automate test execution, to report results, and to gener...