872 search results - page 38 / 175 » UML-based design test generation |
116
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EDOC
2002
IEEE
15 years 6 months ago
2002
IEEE
The EC funded COMBINE Project has the objective of dramatically improving software development productivity by providing a holistic approach to component-based development of Ente...
100
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VTS
1999
IEEE
15 years 6 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
111
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DATE
2008
IEEE
15 years 8 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
180
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ISMIS
2005
Springer
15 years 7 months ago
2005
Springer
Abstract. Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively fe...
GECCO
2005
Springer
15 years 7 months ago
2005
Springer
Several general purpose benchmark generators are now available in the literature. They are convenient tools in dynamic continuous optimization as they can produce test instances w...