872 search results - page 4 / 175 » UML-based design test generation |
DATE
2007
IEEE
15 years 3 months ago
2007
IEEE
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
VLSID
2002
IEEE
15 years 9 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
DAC
2003
ACM
15 years 2 months ago
2003
ACM
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
SAC
2008
ACM
14 years 8 months ago
2008
ACM
In this paper we investigate and propose a fully automated technique to perform conformance checking of Java implementations against UML class diagrams. In our approach, we reused...
ISSRE
2006
IEEE
15 years 3 months ago
2006
IEEE
Practical model validation techniques are needed for model driven development (MDD) techniques to succeed. This paper presents an approach to generating inputs to test UML design ...