872 search results - page 5 / 175 » UML-based design test generation |
ISVLSI
2007
IEEE
15 years 3 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
ITC
1992
IEEE
15 years 1 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
TCAD
2002
14 years 9 months ago
2002
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...
FORTE
1998
14 years 10 months ago
1998
Abstract: We present a new algorithm for automatic test generation for multicast routing. Our algorithm processes a nite state machine (FSM) model of the protocol and uses a mix of...